Symposium on
Scanning Probe Microscopy - imaging and tool
Symposium Chairs: Wolfgang S. Bacsa, Université Paul Sabatier, FR
Synopsis
Progress in nanotechnology depends strongly on imaging techniques and tools to create nanostructures, to position building blocks on precise locations. Scanning probe techniques is the most widely used imaging technique with different interaction fields (force, electronic, magnetic) between probe and scanning surface and a large variety of different operation modes. The same techniques are more and more used as a tool to create nanostructures and as local chemical sensor.
For more information, please contact Wolfgang Bacsa
SPM Topics & Application Areas
- Improved spatial resolution
- Measuring small forces (sub-nN)
- Simultaneous AFM/STM imaging
- Quantitative AFM phase imaging
- Chemical resolution
- Positioning of surface atoms
- Dynamical force microscopy
- UHV STM
- Biological imaging
- Vortex imaging and manipulation
- Scanning Hall probe imaging
- Electrostatic force imaging
- Magnetic force resonance microscopy
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